Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
Hajime Sasaki, K. Hayashi, T. Fujioka, K. Mizuguchi, Byeongdeok Yea, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 37, No. 8, pp. 4301-4305 (1998).
概要BibTeX
Light Emission and Surface States Annealing on GaAs Metal Semiconductor Field-Effect Transistor
Hajime Sasaki, M. Abe, K. Hayashi, T. Fujioka, K. Mizuguchi, Byeongdeok Yea, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 37, No. 2, pp. 455-461 (1998).
概要BibTeX