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K. Hayashi

学術雑誌論文

  1. Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
    Hajime Sasaki, K. Hayashi, T. Fujioka, K. Mizuguchi, Byeongdeok Yea, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 37, No. 8, pp. 4301-4305 (1998).
    BibTeX 概要
  2. Light Emission and Surface States Annealing on GaAs Metal Semiconductor Field-Effect Transistor
    Hajime Sasaki, M. Abe, K. Hayashi, T. Fujioka, K. Mizuguchi, Byeongdeok Yea, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 37, No. 2, pp. 455-461 (1998).
    BibTeX 概要