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K. Mizuguchi

学術雑誌論文

  1. Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
    Hajime Sasaki, K. Hayashi, T. Fujioka, K. Mizuguchi, Byeongdeok Yea, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 37, No. 8, pp. 4301-4305 (1998).
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