Hajime Sasaki
すべて | 1999年 | 1998年 | 1997年学術雑誌論文
- Investigation of Substrate-dependent Characteristics of SnO2 Thin Films with Hall Effect, X-ray Diffraction, X-ray Photoelectron Spectroscopy and Atomic Force Microscopy Measurements
Byeongdeok Yea, Hajime Sasaki, Tomoyuki Osaki, Kazunori Sugahara, Ryousuke Konisi, Japanese Journal of Applied Physics, Vol. 38, No. 4A, pp. 2103-2107 (1999).
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