@InProceedings{67,
  title = {Analysis of GaAs/SiN interface states and hot carrier annealing effects in GaAs MESFET},
  author = {Hajime Sasaki and K. Hayashi and T. Fujioka and K. Mizuguchi and Tomoyuki Osaki and Kazunori Sugahara and Ryousuke Konisi and H. Kasada and K. Ando},
  booktitle = {Applied Surface Science},
  volume = {117},
  number = {118},
  pages = {729--734},
  year = {1997},
  month = {8}
}